Model TI-MMX-SDL
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| Equipped with multiple viewing options to provide users with a complete set of inspection tools: (RF waveform, +/- Rectified waveform and Large Digits). |
| The time-based B-Scan feature displays a cross section of the test material. It is commonly used to display the profile of the bottom surface of the test material. |
| Built in hardware AGC gain control for through paint measurements in multi mode operation. |
| The TI-MMX-SDL has the ability to store 64 custom user defined setups. All factory setups can be selected, edited and saved to any setup location. |
| CE Certified |
| Use the visual alarm to set hi and lo limits for applications requiring specific tolerances. If the actual thickness value is above or below the limits, a red light is illuminated. |
| The high speed scan feature speeds up the inspection process by making 32 measurements per second. Remove transducer from the test material, and display the minimum measurement scanned. |
| Use the find feature to locate the detection point, while automatically adjusting the display to bring the signal into view. |
| The TI-MMX-SDL also comes complete with our Windows® PC software for transferring data to and from a PC. |
| Includes NIST Calibration Certificate |
